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Si (110) 10x10x0.5mm, 1SP, N type undoped, R >1000 ohm-cm - SiUe101005S1R1000 High-throughput Characterization & XRF Sellmeier Equation ( l in
Si (110) 10x10x0.5mm, 1SP, N type undoped, R >1000 ohm-cm - SiUe101005S1R1000 High-throughput Characterization & XRF Sellmeier Equation ( l in
$17.52
Description
Sellmeier Equation ( l in mm ) ho2 (l) = 4
Please contact us to order option Inline carbon filter to maintain a safe laboratory environment
the relative positive pressure level
or it may lose connection from the battery analyzer
please choose our Digital Vacuum Gauge
Si (110) 10x10x0.5mm, 1SP, N type undoped, R >1000 ohm-cm - SiUe101005S1R1000 High-throughput Characterization & XRF Sellmeier Equation ( l inSpecifications: Single crystal: Si Conductive type: N typre, undoped Resistivity: > 1000 ohm cm Size: 10 x 10 x 0. 5 mm Orientation: (110) Polish: one side polished Surface roughness: < 5A RMS Related Products Other Crystal wafer A Z Plasma Cleaner Wafer Containers Dicing saw Film Coater
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 10x10x0.5mm, 1SP, N type undoped, R >1000 ohm-cm - SiUe101005S1R1000 High-throughput Characterization & XRF Sellmeier Equation ( l in){kind=link}
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